What Does ADGIXA Stand For?

ADGIXA stands for Angular Dependent Glancing Incidence X Ray Analysis

ADGIXA, or Angular Dependent Glancing Incidence X Ray Analysis, is a specialized analytical technique utilized in material science and surface characterization. This method involves directing X-ray beams at shallow angles to investigate the structural and compositional properties of thin films and surface layers. By measuring the intensity of reflected X-rays at varying angles, ADGIXA provides insights into film thickness, density, and crystalline structure, enabling precise evaluation of materials in fields such as nanotechnology, semiconductor research, and nanomaterials development.