What Does AEM Stand For?

AEM stands for Auger Electron Microscopy

Auger Electron Microscopy (AEM) is a sophisticated surface analysis technique that utilizes Auger electron emission to provide detailed information about the elemental composition and chemical state of materials at the nanoscale. By focusing a finely focused electron beam onto a sample, AEM analyzes the emitted secondary electrons to map surface features and characterize materials with high spatial resolution. This method is particularly valuable in fields such as materials science, nanotechnology, and semiconductor manufacturing, where understanding surface properties is crucial for advancing technology and innovation.

Other Meanings for AEM