What Does AFM Stand For?

AFM stands for Atomic Force Microscopy

Atomic Force Microscopy (AFM) is a high-resolution imaging technique that allows for the characterization of surfaces at the nanoscale. Utilizing a sharp probe mounted on a flexible cantilever, AFM measures the forces between the probe and the sample surface, enabling detailed topographical mapping and analysis of physical, chemical, and biological properties. This versatile tool is widely used in various fields, including materials science, biology, and nanotechnology, for applications such as studying surface roughness, mechanical properties, and molecular interactions.

Other Meanings for AFM