What Does ASP Stand For?
ASP stands for Auger Sputter Profiling
ASP, or Auger Sputter Profiling, is a surface analysis technique used to characterize the composition and depth profile of thin films and materials. By combining Auger electron spectroscopy with sputtering processes, ASP enables the precise measurement of elemental concentrations as a function of depth. This method provides valuable insights into material properties, layer structures, and compositional variations, making it essential for research and quality control in fields such as materials science, semiconductor manufacturing, and nanotechnology.
Added on 14th April 2008 | Last edited on 16th June 2025 | Edit Acronym