What Does BEEM Stand For?

BEEM stands for Ballistic Electron Emission Microscopy

Ballistic Electron Emission Microscopy (BEEM) is a high-resolution imaging technique that combines scanning tunneling microscopy with electron transport measurements. This method allows for the investigation of electronic properties and interfaces at the nanoscale by analyzing the ballistic transport of electrons through a barrier. BEEM is particularly useful in studying semiconductor materials, metal-semiconductor junctions, and other nanostructured systems, providing insights into their electronic behavior and structural characteristics.