What Does BEI Stand For?

BEI stands for Backscattered Electron Imaging

Backscattered Electron Imaging (BEI) is a high-resolution imaging technique utilized in scanning electron microscopy (SEM) that enhances the visibility of a sample's surface topography and composition. By detecting electrons that are scattered back from the sample surface, BEI provides valuable information about material properties, such as atomic number contrast, enabling researchers to analyze and characterize heterogeneous materials at micro to nanoscale levels. This method is widely applied in materials science, semiconductor analysis, and biological studies.

Other Meanings for BEI