What Does BSEM Stand For?

BSEM stands for Back Scattering Electron Microscopy

BSEM, or Back Scattering Electron Microscopy, is an advanced imaging technique used in materials science and semiconductor research. It employs high-energy electrons to generate high-resolution images by detecting electrons that are scattered back from a specimen's surface. This method provides valuable information about the surface topography and composition, enabling researchers to analyze material properties and structures at the micro and nanoscale. BSEM is particularly useful for studying composite materials, written patterns in semiconductor devices, and various biological specimens.