What Does DAXRT Stand For?

DAXRT stands for Double Axis Reflection X Ray Topography

DAXRT, or Double Axis Reflection X Ray Topography, is an advanced imaging technique used to analyze the structural properties of crystalline materials. By utilizing two axes of reflection, DAXRT enhances the resolution and accuracy of X-ray imaging, enabling detailed visualization of defects, strain, and orientation in crystals. This method is instrumental in materials science research and semiconductor fabrication, providing insights that are critical for the development and optimization of various technologies.