What Does EBIC Stand For?

EBIC stands for Electron Beam Induced Current

Electron Beam Induced Current (EBIC) is a technique used in materials science and semiconductor analysis to measure the electrical response of a sample when subjected to focused electron beam irradiation. By injecting electrons into a material, EBIC facilitates the study of minority carrier dynamics, defect characterization, and junction properties at the nanoscale. This method is particularly valuable for investigating the performance of semiconductor devices, providing insights into their electronic properties and helping to optimize material quality and device design.