What Does EFM Stand For?

EFM stands for Electric Force Microscopy

Electric Force Microscopy (EFM) is a specialized scanning probe technique used to measure electrical forces at the nanoscale. By utilizing an electrically conductive tip, EFM can detect and map the local electric fields and surface charge distributions of materials. This method provides valuable insights into the electrical properties of various samples, including semiconductors and biomaterials, aiding in research and development across fields such as material science, nanotechnology, and condensed matter physics. EFM enhances our understanding of electronic phenomena by delivering high-resolution, quantitative data on electrical characteristics at a microscopic scale.