What Does FIB Stand For?

FIB stands for Focused Ion Beam

FIB, or Focused Ion Beam, is a sophisticated technique used in materials science and microfabrication that employs a finely focused beam of ions to analyze, modify, or fabricate materials at the microscale. Utilizing ion beams allows for high precision in etching, milling, and imaging, making it instrumental in semiconductor manufacturing, nanotechnology research, and the development of advanced materials. FIB systems enable researchers and engineers to manipulate structures at the atomic level, providing critical insights and innovations across various fields.