What Does FIM Stand For?

FIM stands for Field Ion Microscopy

Field Ion Microscopy (FIM) is a high-resolution microscopy technique that utilizes a sharp metal tip, typically made of tungsten, to create ionized atoms from a sample surface by applying a strong electric field. This innovative method allows for the visualization of individual atoms and subatomic structures, providing critical insights into materials science, nanotechnology, and surface phenomena. FIM is particularly valuable for studying the morphology, chemical composition, and atomic arrangements of surfaces at the atomic scale.

Other Meanings for FIM