What Does GIXA Stand For?

GIXA stands for Glancing Incidence X Ray Analysis

GIXA, or Glancing Incidence X Ray Analysis, is a sophisticated analytical technique used to investigate the structural and compositional characteristics of thin films and surface layers. By employing X-ray beams at shallow angles, GIXA enhances sensitivity to surface structures, enabling researchers to obtain high-resolution data on material composition, crystallinity, and thickness. This method is widely utilized in materials science, nanotechnology, and semiconductor research, providing crucial insights for the development and characterization of advanced materials.