What Does GIXD Stand For?

GIXD stands for Grazing Incidence X Ray Diffraction

Grazing Incidence X-Ray Diffraction (GIXD) is a powerful analytical technique used to investigate the structure of thin films and surfaces at the nanoscale. By directing X-rays at a shallow angle to the surface, GIXD enhances the scattering signal from the material, enabling the study of crystallographic properties, ordering, and phase transitions. This technique is particularly valuable in materials science, nanotechnology, and surface science for characterizing complex materials, such as organic semiconductors, thin films, and multilayer structures.