What Does GIXR Stand For?

GIXR stands for Grazing Incidence X Ray Reflectivity

GIXR, or Grazing Incidence X Ray Reflectivity, is a powerful analytical technique used to investigate the structural properties of thin films and multilayered materials at the nanoscale. By directing X-rays at a very shallow angle to the surface of a sample, GIXR enables the precise measurement of parameters such as thickness, density, and roughness, providing insights into surface and interface characteristics. This method is widely applied in materials science, nanotechnology, and semiconductor research, facilitating advancements in the development of new materials and coatings.