What Does GIXS Stand For?

GIXS stands for Grazing Incidence X Ray Scattering

GIXS, or Grazing Incidence X-Ray Scattering, is a sophisticated analytical technique used to study the structural properties of materials at the nanoscale. By directing X-rays at a shallow angle to the sample surface, GIXS provides detailed information about the arrangement and organization of atoms within thin films, surfaces, and interfaces. This method is particularly valuable in fields such as materials science, nanotechnology, and solid-state physics, enabling researchers to gain insights into molecular structures, crystallinity, and phase transitions.