What Does KFM Stand For?

KFM stands for Kelvin Probe Force Microscopy

KFM, or Kelvin Probe Force Microscopy, is a sophisticated technique that combines atomic force microscopy (AFM) with electrostatic potential measurement. It is primarily used to map the work function and surface potential of materials at the nanoscale. By analyzing the interaction between a conductive atomic force microscope tip and a sample's surface, KFM provides valuable insights into electronic properties, charge distribution, and surface characteristics, making it an essential tool in material science and nanotechnology research.