What Does SICM Stand For?

SICM stands for Scanning Ion Conductance Microscopy

Scanning Ion Conductance Microscopy (SICM) is a high-resolution scanning probe technique that allows for the imaging and characterization of biological and artificial surfaces at the nanoscale. By utilizing an ion-conductive nanopipette that scans above the sample, SICM measures ion current variations to map topographical features and properties of the specimen without requiring direct contact. This technique enables studies of delicate structures, such as living cells, under physiological conditions while providing insights into surface chemistry and electrical properties. SICM is valuable in fields such as materials science, biology, and nanotechnology.