What Does SIDLTS Stand For?

SIDLTS stands for Scanning Ion Deep Level Transient Spectroscopy

SIDLTS, or Scanning Ion Deep Level Transient Spectroscopy, is an advanced analytical technique used to investigate the electronic properties of semiconductor materials. It identifies and characterizes deep-level defects by capturing transient capacitance signals as a function of temperature and bias voltage. This method enhances spatial resolution through scanning techniques, allowing for detailed mapping of electronic states and defects within semiconductors, which is crucial for improving device performance and understanding material behavior in various applications.