What Does SILC Stand For?

SILC stands for Stress Induced Leakage Current

SILC, or Stress Induced Leakage Current, refers to the phenomenon where increased electrical stress in semiconductor devices leads to unintended leakage current. This effect is crucial in understanding the reliability and performance of electronic components, as it can significantly impact their functionality and lifespan. Identifying and mitigating SILC is essential for optimizing device design and ensuring consistent operation under varying conditions.