What Does SIMS Stand For?

SIMS stands for Secondary Ion Mass Spectrometry

Secondary Ion Mass Spectrometry (SIMS) is an analytical technique used to characterize the surface composition of solid materials. It involves bombarding a sample with a primary ion beam, which dislodges secondary ions from the surface. These secondary ions are then collected and analyzed using a mass spectrometer. SIMS is capable of providing high spatial resolution and sensitivity, making it an important tool in fields such as materials science, biology, and semiconductor manufacturing for analyzing trace elements and isotopic composition.

Other Meanings for SIMS