What Does SKPM Stand For?

SKPM stands for Scanning Kelvin Probe Microscopy

SKPM, or Scanning Kelvin Probe Microscopy, is a highly sensitive scanning probe technique used to measure the surface potential of materials at the nanoscale. This method allows for the quantitative mapping of electrical properties, such as work function variations and local charge distributions, by detecting changes in electrostatic forces between a conductive probe and the sample surface. SKPM is widely utilized in research fields such as materials science, semiconductor technology, and surface physics, providing valuable insights into the electronic behavior of materials.