What Does SPFM Stand For?

SPFM stands for Scanning Polarization Force Microscopy

Scanning Polarization Force Microscopy (SPFM) is a specialized imaging technique that employs a scanning probe to measure variations in surface forces at the nanoscale while simultaneously analyzing the polarization-dependent interaction between a probe tip and a surface. This method enables high-resolution mapping of surface properties, including electric and magnetic polarization phenomena, making it valuable for research in materials science, physics, and nanotechnology. SPFM enhances our understanding of surface phenomena and materials behavior by providing insights into molecular and atomic interactions.