What Does SSIMS Stand For?

SSIMS stands for Static Secondary Ion Mass Spectrometry

SSIMS, or Static Secondary Ion Mass Spectrometry, is an advanced analytical technique utilized for the detailed characterization of surface compositions. This method involves the bombardment of a sample with a primary ion beam, leading to the ejection of secondary ions from the surface. The collected secondary ions are then analyzed using mass spectrometry to determine their mass-to-charge ratios, providing valuable insights into the elemental and isotopic composition of the material. SSIMS is widely applied in fields such as materials science, nanotechnology, and semiconductor research due to its high spatial resolution and sensitivity.