What Does TDDB Stand For?

TDDB stands for Time Dependent Dielectric Breakdown

TDDB, or Time Dependent Dielectric Breakdown, refers to the phenomenon in which the dielectric materials within electronic components degrade over time when subjected to electric fields. This degradation can lead to the gradual failure of insulating properties, potentially resulting in electrical shorts or component failure. TDDB is a critical reliability issue in the semiconductor and electronics industries, as it affects the longevity and performance of devices, particularly in high-density and high-voltage applications. Understanding TDDB is essential for improving material selection, design processes, and testing methodologies to enhance the reliability of electronic systems.