What Does TRAXS Stand For?

TRAXS stands for Total Reflection Angle X Ray Spectroscopy

TRAXS, or Total Reflection Angle X Ray Spectroscopy, is an advanced analytical technique used to study the elemental composition and chemical states of materials. By utilizing the principle of total internal reflection, TRAXS enhances the sensitivity and spatial resolution of X-ray spectroscopy. This method is particularly effective for thin films and surface layers, enabling detailed surface characterization and analysis in various fields, including materials science, nanotechnology, and surface chemistry. TRAXS provides valuable insights into material properties, facilitating advancements in research and industrial applications.