What Does XRR Stand For?

XRR stands for X Ray Reflectometry

XRR, or X Ray Reflectometry, is a sophisticated characterization technique used to analyze the structure and thickness of thin films and layered materials at the nanoscale. By measuring the intensity of X-rays reflected from a surface as a function of the angle of incidence, XRR provides valuable insights into surface roughness, film density, and optical properties. This non-destructive method is widely employed in research and industrial applications, including semiconductor manufacturing, materials science, and coatings analysis.