What Does XTEM Stand For?

XTEM stands for Cross Sectional Transmission Electron Microscopy

XTEM, or Cross Sectional Transmission Electron Microscopy, is a specialized imaging technique that allows for the detailed examination of materials at the nanoscale. By providing high-resolution cross-sectional images, XTEM enables researchers to analyze the internal structure, composition, and properties of various materials, including metals, semiconductors, and biological specimens. This powerful method is instrumental in fields such as materials science, nanotechnology, and semiconductor fabrication, facilitating advancements through its ability to visualize and characterize complex interfaces and microstructures.